Byabazaire, J.; O’Hare, G.M.P.; Collier, R.; Kulatunga, C.; Delaney, D.
A Comprehensive Approach to Assessing Yield Map Quality in Smart Agriculture: Void Detection and Spatial Error Mapping. Agronomy 2023, 13, 1943.
https://doi.org/10.3390/agronomy13071943
AMA Style
Byabazaire J, O’Hare GMP, Collier R, Kulatunga C, Delaney D.
A Comprehensive Approach to Assessing Yield Map Quality in Smart Agriculture: Void Detection and Spatial Error Mapping. Agronomy. 2023; 13(7):1943.
https://doi.org/10.3390/agronomy13071943
Chicago/Turabian Style
Byabazaire, John, Gregory M. P. O’Hare, Rem Collier, Chamil Kulatunga, and Declan Delaney.
2023. "A Comprehensive Approach to Assessing Yield Map Quality in Smart Agriculture: Void Detection and Spatial Error Mapping" Agronomy 13, no. 7: 1943.
https://doi.org/10.3390/agronomy13071943
APA Style
Byabazaire, J., O’Hare, G. M. P., Collier, R., Kulatunga, C., & Delaney, D.
(2023). A Comprehensive Approach to Assessing Yield Map Quality in Smart Agriculture: Void Detection and Spatial Error Mapping. Agronomy, 13(7), 1943.
https://doi.org/10.3390/agronomy13071943