Kim, H.; Du, X.; Kim, S.; Kim, P.; Wijesinghe, R.E.; Yun, B.-J.; Kim, K.-M.; Jeon, M.; Kim, J.
Non-Invasive Morphological Characterization of Rice Leaf Bulliform and Aerenchyma Cellular Regions Using Low Coherence Interferometry. Appl. Sci. 2019, 9, 2104.
https://doi.org/10.3390/app9102104
AMA Style
Kim H, Du X, Kim S, Kim P, Wijesinghe RE, Yun B-J, Kim K-M, Jeon M, Kim J.
Non-Invasive Morphological Characterization of Rice Leaf Bulliform and Aerenchyma Cellular Regions Using Low Coherence Interferometry. Applied Sciences. 2019; 9(10):2104.
https://doi.org/10.3390/app9102104
Chicago/Turabian Style
Kim, Hyeree, XiaoXuan Du, Sungwook Kim, Pilun Kim, Ruchire Eranga Wijesinghe, Byoung-Ju Yun, Kyung-Min Kim, Mansik Jeon, and Jeehyun Kim.
2019. "Non-Invasive Morphological Characterization of Rice Leaf Bulliform and Aerenchyma Cellular Regions Using Low Coherence Interferometry" Applied Sciences 9, no. 10: 2104.
https://doi.org/10.3390/app9102104
APA Style
Kim, H., Du, X., Kim, S., Kim, P., Wijesinghe, R. E., Yun, B. -J., Kim, K. -M., Jeon, M., & Kim, J.
(2019). Non-Invasive Morphological Characterization of Rice Leaf Bulliform and Aerenchyma Cellular Regions Using Low Coherence Interferometry. Applied Sciences, 9(10), 2104.
https://doi.org/10.3390/app9102104