Article Versions Notes

Minkov D, Angelov G, Marquez E, Radonov R, Rusev R, Nikolov D, Ruano S. Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample. Nanomaterials. 2023; 13(17):2407. https://doi.org/10.3390/nano13172407

Minkov, Dorian, George Angelov, Emilio Marquez, Rossen Radonov, Rostislav Rusev, Dimitar Nikolov, and Susana Ruano. 2023. "Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample" Nanomaterials 13, no. 17: 2407. https://doi.org/10.3390/nano13172407

Minkov, D., Angelov, G., Marquez, E., Radonov, R., Rusev, R., Nikolov, D., & Ruano, S. (2023). Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample. Nanomaterials, 13(17), 2407. https://doi.org/10.3390/nano13172407