Liu, B.; Noor-ul-Amin, M.; Khan, I.; Ismail, E.A.A.; Awwad, F.A.
Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring. Processes 2023, 11, 2893.
https://doi.org/10.3390/pr11102893
AMA Style
Liu B, Noor-ul-Amin M, Khan I, Ismail EAA, Awwad FA.
Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring. Processes. 2023; 11(10):2893.
https://doi.org/10.3390/pr11102893
Chicago/Turabian Style
Liu, Botao, Muhammad Noor-ul-Amin, Imad Khan, Emad A. A. Ismail, and Fuad A. Awwad.
2023. "Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring" Processes 11, no. 10: 2893.
https://doi.org/10.3390/pr11102893
APA Style
Liu, B., Noor-ul-Amin, M., Khan, I., Ismail, E. A. A., & Awwad, F. A.
(2023). Integration of Bayesian Adaptive Exponentially Weighted Moving Average Control Chart and Paired Ranked-Based Sampling for Enhanced Semiconductor Manufacturing Process Monitoring. Processes, 11(10), 2893.
https://doi.org/10.3390/pr11102893
