Nalimov, A.; Stafeev, S.; Kotlyar, V.; Kozlova, E.
Optical Sensor Methodology for Measuring Shift, Thickness, Refractive Index and Tilt Angle of Thin Films. Photonics 2023, 10, 690.
https://doi.org/10.3390/photonics10060690
AMA Style
Nalimov A, Stafeev S, Kotlyar V, Kozlova E.
Optical Sensor Methodology for Measuring Shift, Thickness, Refractive Index and Tilt Angle of Thin Films. Photonics. 2023; 10(6):690.
https://doi.org/10.3390/photonics10060690
Chicago/Turabian Style
Nalimov, Anton, Sergey Stafeev, Victor Kotlyar, and Elena Kozlova.
2023. "Optical Sensor Methodology for Measuring Shift, Thickness, Refractive Index and Tilt Angle of Thin Films" Photonics 10, no. 6: 690.
https://doi.org/10.3390/photonics10060690
APA Style
Nalimov, A., Stafeev, S., Kotlyar, V., & Kozlova, E.
(2023). Optical Sensor Methodology for Measuring Shift, Thickness, Refractive Index and Tilt Angle of Thin Films. Photonics, 10(6), 690.
https://doi.org/10.3390/photonics10060690