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Application of X-Ray Photoelectron Spectroscopy

A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".

Deadline for manuscript submissions: 20 June 2025 | Viewed by 621

Special Issue Editor


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Guest Editor
ENEA-Italian National Agency for New Technologies, Energy and Sustainable Economic Development, DivisionTechnologies and Processes of Sustainable Materials (PROMAS), Laboratory MATAS (Functional MAterials and Technologies for Sustainable ApplicationS)-Brindisi Research Center, S.S. 7 Appia km. 706, 72100 Brindisi, Italy
Interests: XPS measurements on oxides; quantitative DP through Ar+2500 cluster gun; thin films by XPS analyses; surface treatments; XPS investigation about health materials

Special Issue Information

Dear Colleagues,

The importance of X-ray photoelectron spectroscopy in the international field of surface science research has not yet been explored. This characterization technique is very powerful for determining the chemical composition of any kind of sample provided the material is compatible with the UHV examination conditions of the analysis chamber. Multielemental and chemically complex samples can be analyzed without any reference specimen for comparison to assess their chemical elements and their relative atomic relative percentages. We are therefore interested in articles that investigate materials by means of X-ray photoelectron spectroscopy with particular attention on quantitive analyses. Potential topics include, but are not limited to, the following:

  1. Hard thin-flm materials for aeronautical applications;
  2. Antimicrobic and antifungal layers/multilayers for human health;
  3. Studies of the complex compound FeTi2O5 (iron–psedudobrookite) after annealing in inert environmental as well as oxidative atmospheres;
  4. Ceramic oxides doped with metal nanoparticles: the new frontiers of ceramic conductors;
  5. Composite materials (reinforced with fibers) for advanced applications in the field of transport;
  6. Novel findings about depth profiling measurements by employing an in situ cluster ion gun;
  7. Investigations on the surface properties of recycled materials in the field of renewable energy sources;
  8. Different areas of application and critical analysis relating to substitution techniques of X-ray photoelectron spectroscopy (XPS).

Dr. Luciana Mirenghi
Guest Editor

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Keywords

  • thin films
  • doped oxide ceramics
  • new antimicrobic films (overcoming silver)
  • hard coatings
  • quantitative depth profiling
  • recycled materials
  • XPS

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Published Papers (1 paper)

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Research

14 pages, 4020 KiB  
Article
Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser
by Joakim Laksman, Florian Dietrich, Theophilos Maltezopoulos, Jia Liu, Danilo Enoque Ferreira de Lima, Natalia Gerasimova, Ivars Karpics, Naresh Kujala, Philipp Schmidt, Suren Karabekyan, Svitozar Serkez and Jan Grünert
Appl. Sci. 2024, 14(22), 10152; https://doi.org/10.3390/app142210152 - 6 Nov 2024
Viewed by 447
Abstract
Angle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and characterize the performance of our two operational [...] Read more.
Angle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and characterize the performance of our two operational photoelectron spectrometers for the application of hard X-rays and soft X-rays as well as new automation tools and online data analysis that enable continuous support for machine operators and instrument scientists. Customized software has been developed for the real-time monitoring of photon beam polarization and spectral distribution both in single-color and two-color operation. Hard X-ray operation imposes specific design challenges due to poor photoionization cross-sections and very high photoelectron velocities. Furthermore, recent advancements in machine learning enable resolution enhancement by training the photoelectron spectrometer together with an invasive high-resolution spectrometer, which generates a response function model. Full article
(This article belongs to the Special Issue Application of X-Ray Photoelectron Spectroscopy)
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