Fault-Tolerant Design for Safety-Critical Applications
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Circuit and Signal Processing".
Deadline for manuscript submissions: closed (15 May 2024) | Viewed by 2872
Special Issue Editor
Interests: approximate computing; asynchronous circuits; computer arithmetic; digital integrated circuits; fault-tolerant design; reliability; logic synthesis
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Many real-world safety-critical applications such as space, aerospace, defense, nuclear power plants, electric power transmission and distribution, industrial control and automation, and banking and finance systems usually involve fault-tolerant design at the hardware and/or software level for enhanced reliability. Fault-tolerant design is essential to cope with faults or failures of underlying circuits and systems during routine operation and while operating in harsh environments. In this context, this Special Issue aims to deal with recent advances in fault-tolerant design at hardware and software levels. Given this, we invite the submission of high-quality academic and industrial research work on all aspects of fault-tolerant design and reliability for publication. The topics of interest are broad and address fault-tolerant electrical, electronic, computer, and communication systems, as mentioned below:
- Methods for assessing the reliability of devices, circuits, and systems
- Fault tolerance in low power electronics: microelectronics, nanoelectronics, and optoelectronics
- Fault tolerance in memories
- Fault tolerance in communication systems (networks, network-on-chip, etc.)
- Fault tolerance in high-power electronics
- Fault-tolerant design of electrical machines
- Fault tolerance in renewable energy systems including solar, wind, wave, geothermal, etc.
- Fault tolerance in emerging (post-CMOS) technologies
- Software fault tolerance
- Impact of radiation on reliability of devices, circuits, and systems
- Reliability studies on MEMS, sensors, photonic devices, wafer-level packaging, and assembly and interconnects
- Reliability of microwave devices and circuits
- Modeling reliability versus aging in low-power and high-power electronics
- Reliability assessment of batteries
- Reliability assessment and prediction in space, aerospace, and automotive systems
Dr. Padmanabhan Balasubramanian
Guest Editor
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