Advanced Magnetic and Electrical Characterization Techniques
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Electronic Materials".
Deadline for manuscript submissions: closed (15 November 2022) | Viewed by 8851
Special Issue Editors
Interests: magnetic characterization techniques; low level signal processing; electrical characterization techniques; spintronic structures; galvanomagnetic effects; magnetic nanoparticles detection; micromagnetic simulations
Interests: investigation of magnetic properties of materials at high and low temperatures, magnetoresistance and magnetocaloric effect characterization; preparation and investigation of nanomaterials
Special Issue Information
Dear Colleagues,
The emerging field of new phenomena and new materials requires highly sensitive, accurate, and non-invasive magnetic and electrical characterization techniques to investigate structures and devices at micro- and nanoscale. In addition to classical magnetic investigation methods, such as vibrating sample magnetometer, fluxgate, MOKE, or superconducting quantum interference device (SQUID), used to measure extremely subtle magnetic fields, there is also magnetic force microscopy or scanning probe Hall microscopy for high-resolution quantitative magnetic field mapping measurements at the micrometer down to nanometer scale. The planar Hall Effect and spin Hall Effect are now widely used to characterize magnetic reversal processes, domain wall dynamics, spin transfer torque, or spin–orbit torque in spintronic structures.
Graphene layers and carbon nanotubes have outstanding properties waiting to be investigated in a broad range of temperatures and electric and magnetic fields. Capacitance–voltage (CV) profiling, admittance spectroscopy (AS), deep-level transient spectroscopy (DLTS), drive-level capacitance profiling (DLCP), photocapacitance, and many other techniques are used to characterize thin-film solar cells. Numerical simulation methods are used to complete and explain the results obtained through experiments.
The enumeration of these investigation techniques is not stopping here and is open to new and innovative ones that are waiting to be presented in this Special Issue.
This Special Issue aims to publish original contributions on cutting-edge experimental techniques and numerical simulation methods used to characterize micro- and nanoscale structures and devices from both a magnetic and electrical point of view. This way, the Special Issue can become a valuable dissemination platform and source of scientific information for researchers and engineers that are using such characterization techniques.
Dr. Marius Volmer
Dr. Adrian Bezergheanu
Guest Editors
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Keywords
- magnetic characterization techniques
- electrical characterization techniques
- DC and AC magnetometry
- magnetic force microscopy
- characterization of magnetic nanostructures
- numerical simulations
- Hall effect magnetometry
- electrochemical impedance spectroscopy
- capacitance spectroscopy
- lab on a chip
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