Progress in Optical Characterization of Semiconductor Nanomaterials and Devices
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 May 2023) | Viewed by 5710
Special Issue Editor
Special Issue Information
Dear Colleagues,
Advanced optical characterization techniques are powerful contactless tools able to probe semiconductor (nano)material and device properties. When correlated to microscopy, spectroscopic techniques provide impressive results at the nanoscale, not only to the fundamental understanding of structural and optical properties of nanostructures, but also insight into device limitations. This Special Issue will cover the latest achievements and challenges of optical techniques in order to study semiconductor (nano)materials and devices.
Topics covered include but are not limited to:
- Photoluminescence, ionoluminescence, spectroscopic ellipsometry, absorption, Fourier-transform infrared spectroscopy (FTIR), Raman and surface/tip-enhanced Raman spectroscopy (SERS, TERS), scanning near-field optical microscopy (nano-FTIR, nano-THz spectroscopy);
- Cathodoluminescence, scanning and transmission electron microscopy, energy-dispersive x-ray spectroscopy;
- Photocurrent, electroluminescence, electron beam induced current;
- III-N (InN, GaN, AlN), oxide (Ga2O3, NiO2, ZnO), III-V (GaAs, InP, InAs) semiconductors (nanowires, quantum dots, heterostructures), 2D materials (2D transition metal dichalcogenides, MXenes) and devices (solid-state emitters, photonics, plasmonics, spintronics, photovoltaics, transistors, thermoelectrics, batteries, supercapacitors, sensors applications);
- Theory and simulation.
Dr. Nabiha Ben Sedrine
Guest Editor
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Keywords
- optical properties
- structural properties
- luminescence
- microscopy
- semiconductors
- nanomaterials
- devices
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