Advances in Magnetic Measurements
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: 25 March 2025 | Viewed by 1456
Special Issue Editor
Interests: microelectronics; micro-electromechanical systems; accelerator technology; sensors; systems and interfacing; precision measurement; magnetic measurement
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The goal of this Special Issue is to provide a forum for colleagues to publish novel research results related to the techniques and equipment used to measure, model, characterise and fiducialise magnetic fields in a wide variety of applications.
This Special Issue aims to include fundamental and industrial research covering the following:
- Fundamental problems and challenges, magnetisation domains and processes.
- High-frequency and low-frequency magnetic measurements.
- Magnetic measurement concepts and techniques.
- Magnetic sensors and magnetic instruments.
- Modelling and measurement of magnetic properties of soft magnetic materials, including aspects of microstructures.
- Characterisation of permanent magnets and their measurements.
- Characterisation of electromagnets and their measurements.
- Characterisation of superconducting magnets and their measurements.
- Characterisation of novel magnetic structures and their measurements.
- Industrial magnetic measurements and testing, including magnetic standards.
- Bio-electromagnetic testing and non-destructive magnetic testing.
- Magnetic sensors.
- Magnetic metrology.
- Magnetostriction, magnetocaloric and anisotropy measurement.
- Modelling of magnetic material behaviours (characteristics under scalar and/or vectorial magnetic excitations, including harmonics and DC offsets, hysteresis and power losses, coupled phenomena, etc.)
- Relevance to applications in electromagnetic devices (transformers, motors, etc.)
- Magnetic measurements for big science subsystems, including accelerator magnets and insertion devices.
- Any other relevant topics.
Dr. Nicholas Sammut
Guest Editor
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Metrology is an international peer-reviewed open access quarterly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1000 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
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