Selected Papers from 9th International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2023) and 5th International Conference on Microelectronic Devices and Technologies (MicDAT '2023)
A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "A：Physics".
Deadline for manuscript submissions: closed (31 December 2023) | Viewed by 635
Special Issue Editor
Interests: smart sensors; optical sensors; frequency measurements
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The 9th Annual International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2023) is a forum for the presentation, discussion, and exchange of information and latest research and development results in both theoretical and experimental research in sensors, transducers and their related fields, including artificial intelligence-based sensors and sensor systems. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the field of sensors and measurements.
After successful events in 2015 (Dubai, UAE), 2016 (Barcelona, Spain), 2017 (Moscow, Russia), 2018 (Amsterdam, the Netherlands), 2019 (Tenerife (Canary Islands), Spain), 2020 (Porto, Portugal), 2021 (Palma de Mallorca (Balearic Islands), Spain), 2022 (Corfu, Greece), the SEIA' 2023 will take place in Funchal (Madeira Island, Portugal) on 20–22 September 2023 in co-location with the 5th IFSA Frequency and Time Conference (IFTC' 2023) and the 5th International Conference on Microelectronic Devices and Technologies (MicDAT '2023) under the same conference umbrella in-person format.
This Special Issue contains extended papers from SEIA' 2023 (https://seia-conference.com/) and MicDAT '2023 (https://www.micdat-conference.com/).
Dr. Sergey Y. Yurish
Guest Editor
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Keywords
- microelectronic devices
- optoelectronics
- sensors
- transducers
- measuring instrumentation
- MEMS and NEMS
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