Electronic Test and Measurement Instrumentation: Design and Applications
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".
Deadline for manuscript submissions: closed (30 March 2024) | Viewed by 25775
Special Issue Editors
Interests: photoacoustics (hardware and applications); electronic test and measurement instrumentation (design and applications, hardware, firmware and software; whole systems and single instruments design); embedded systems; microcontrollers (hardware, firmware and applications); project management
Special Issues, Collections and Topics in MDPI journals
Interests: analog electronics; embedded systems; IoT
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Test and measurement instrumentation covers a large portion of the modern electronics and automation field. Current testing and measurement techniques range from ultrasmall, nanometer-scale semiconductor manufacturing issues to high-power, large-scale devices and systems. Moreover, the domains of testing and instrumentation are not just limited to electronics and circuits but also include photonics, radio electronics (wireless electronics), and many more.
This Special Issue of Sensors aims to present advances in such test and measurement solutions in various domains. Topics include, but are not limited to, the following:
- Front-end electronics;
- Signal conditioning;
- Digital signal processing;
- Data processing;
- Control;
- Communication with sensors and in sensor systems;
- Energy harvesting.
Prof. Dr. Tomasz Starecki
Dr. Piotr Z. Wieczorek
Guest Editors
Manuscript Submission Information
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Keywords
- front-end electronics
- signal conditioning
- digital signal processing
- data processing
- control
- communication with sensors and in sensor systems
- energy harvesting
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