SPAD Image Sensors
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Physical Sensors".
Deadline for manuscript submissions: closed (30 April 2021) | Viewed by 89553
Special Issue Editors
Interests: modeling and characterization of electron devices; CMOS integrated photodetectors and image sensors; single-Photon Avalanche Diodes; 3D Imaging; radiation detectors
Special Issues, Collections and Topics in MDPI journals
Interests: image sensors; analog integrated circuits; terahertz and infrared detectors; microelectronics; single photon imaging
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent years, integrated sensors based on single-photon avalanche diodes (SPADs) have definitely entered the market, providing optical detector systems with low-noise and picosecond timing resolution. An increasing amount of work is steadily going on in academia as well as in the industry to increase sensor performance and functionality towards time-resolved single-photon imaging. The simultaneous optimization of fabrication processes, circuits, and architectures is required to advance the state-of-the-art of art in this field and to enable an increasing number of applications in basic physics, biomedical, industrial, and consumer domains.
This Special Issue aims at providing an overview of the latest developments in CMOS-integrated SPAD pixel arrays, including work on detectors, pixels, readout circuits, chip architectures, and related applications. Submissions can span from technology processes to design and circuit innovations, from system-level analysis and optimization to electrical and optical characterization, all in relation to SPAD image sensors.
Prof. Dr. Lucio Pancheri
Dr. Matteo Perenzoni
Guest Editors
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Keywords
- Single-photon avalanche diode
- Geiger-mode avalanche photodiode
- SPAD Image Sensor
- SPAD array
- CMOS
- Single-photon imaging
- Photon counting
- Photon timing
- Time-resolved imaging
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