Sensors and Analog Front-End Circuits for IoT Systems and High Sensitivity Measurements
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Electronic Sensors".
Deadline for manuscript submissions: closed (30 June 2024) | Viewed by 27829
Special Issue Editors
Interests: circuit design; IC testing; signal processing
Special Issues, Collections and Topics in MDPI journals
Interests: position sensors; magnetic sensors; IoT
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
IoT systems use many sensors and their analog front-end circuits are very important; they should be low-cost, low-power and be of small size . On the other hand, high-sensitivity measurement sensors for weak signals are performance-oriented. This Special Issue deals with sensors and analog front-end circuits for IoT systems and high-sensitivity measurements, including the design, calibration and testing technologies as well as the novel concepts. New sensors and new architectures of analog front-end circuits for IoT systems and high-sensitivity measurements are covered in this Special Issue. The related technologies to achieve a high performance, low cost, miniature size, one-chip integration, board integration, high reliability, calibration for high accuracy, and testing for mass production as well as the following digital signal processing algorithms and systems are also covered. We are looking for original contributions to these areas.
Prof. Dr. Haruo Kobayashi
Toshio Iino
Dr. Anna Kuwana
Guest Editors
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Keywords
- Sensors for IoT systems
- High-sensitivity measurement
- Sensors for the aboves (image sensors, photo sensors, magnetic sensors, acceleration sensors, gyro sensors, temperature sensors, position sensors, strain sensors, pressure sensors, sounds sensors, flow sensors, gas sensors, soil sensors, biomagnetism sensors, and so on)
- Integrated sensors
- MEMS sensors
- Analog filter
- Op amp
- Delta-sigma ADC
- Incremental ADC
- SAR ADC
- Analog signal conditioning
- Calibration
- Testing
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