Order Article Reprints

Liao R-Y, Chen H-H, Lin P-Y, Liang T-A, Su K-H, Lin I-C, Wen C-H, Chou W-C, Hsu H-H, Cheng C-H. Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials. 2023; 16(9):3306. https://doi.org/10.3390/ma16093306

Liao, Ruo-Yin, Hsuan-Han Chen, Ping-Yu Lin, Ting-An Liang, Kuan-Hung Su, I-Cheng Lin, Chen-Hao Wen, Wu-Ching Chou, Hsiao-Hsuan Hsu, and Chun-Hu Cheng. 2023. "Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices" Materials 16, no. 9: 3306. https://doi.org/10.3390/ma16093306

Liao, R. -Y., Chen, H. -H., Lin, P. -Y., Liang, T. -A., Su, K. -H., Lin, I. -C., Wen, C. -H., Chou, W. -C., Hsu, H. -H., & Cheng, C. -H. (2023). Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials, 16(9), 3306. https://doi.org/10.3390/ma16093306