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Jurczyk J, Pillatsch L, Berger L, Priebe A, Madajska K, Kapusta C, Szymańska IB, Michler J, Utke I. In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum. Nanomaterials. 2022; 12(15):2710. https://doi.org/10.3390/nano12152710

Jurczyk, Jakub, Lex Pillatsch, Luisa Berger, Agnieszka Priebe, Katarzyna Madajska, Czesław Kapusta, Iwona B. Szymańska, Johann Michler, and Ivo Utke. 2022. "In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum" Nanomaterials 12, no. 15: 2710. https://doi.org/10.3390/nano12152710

Jurczyk, J., Pillatsch, L., Berger, L., Priebe, A., Madajska, K., Kapusta, C., Szymańska, I. B., Michler, J., & Utke, I. (2022). In Situ Time-of-Flight Mass Spectrometry of Ionic Fragments Induced by Focused Electron Beam Irradiation: Investigation of Electron Driven Surface Chemistry inside an SEM under High Vacuum. Nanomaterials, 12(15), 2710. https://doi.org/10.3390/nano12152710