Advanced Studies in Coordinate Measuring Technique
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: 20 May 2025 | Viewed by 811
Special Issue Editor
Interests: coordinate metrology (in scales ranging from nanometers to large volume objects); in-process metrology; coordinate measuring systems (including portable measuring systems and computed tomography systems); measurement accuracy; simulation and numerical methods in metrology (especially the Monte Carlo method); methods for identifying and correcting geometric errors of machines
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
This Special Issue focus on the advanced studies of coordinate measuring techniques. We mainly include the extended version of the conference paper from the XV International Scientific Conference ‘Coordinate Measuring Technique’ CMT24. However, we also welcome submissions from other research groups.
We welcome original research, case studies, and practical implementations focused on, but not limited to, the following:
- development in a field of coordinate measuring techniques,
- coordinate measuring machines,
- theory of coordinate measurements,
- measurement uncertainty,
- traceability and inspection of coordinate measuring systems,
- use of metrology in the production of machine elements,
- the role and tasks of metrology in quality assurance systems,
- new trends in surface measurements,
- visualization and virtualization techniques,
- metrology in The Fourth Industrial Revolution,
- coordinate metrology education,
- geometrical product specification.
Prof. Dr. Adam Gąska
Guest Editor
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- development in a field of coordinate measuring techniques
- coordinate measuring machines
- theory of coordinate measurements
- measurements uncertainty
- traceability and inspection of coordinate measuring systems
- use of metrology in the production of machine elements
- the role and tasks of metrology in quality assurance systems
- new trends in surface measurements
- visualization and virtualization techniques
- metrology in The Fourth Industrial Revolution
- coordinate metrology education
- geometrical product specification
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