Recent Advances in Optical Coordinate Measuring Systems
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: closed (20 August 2024) | Viewed by 5168
Special Issue Editors
Interests: coordinate metrology (in scales ranging from nanometers to large volume objects); in-process metrology; coordinate measuring systems (including portable measuring systems and computed tomography systems); measurement accuracy; simulation and numerical methods in metrology (especially the Monte Carlo method); methods for identifying and correcting geometric errors of machines
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Interests: coordinate measuring technique; contact and contactless measurements; simulation and modeling of measuring systems, especially those with open kinematic chain; coordinate metrology in medicine and bioengineering; in-process/in-line metrology
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Interests: mechanical engineering; coordinate metrology and its applications in production engineering; micro- and nanodimensional metrology; calibration methods for coordinate systems; fringe optics systems and photogrammetry; metrological aspects of reverse engineering; metrology in industrial design and Industry 4.0; quality engineering and quality management systems
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Coordinate measuring systems offer high accuracy, automation of measurements and universality, which translates into shortening of the measurement time, which is one of the most sought-after aspects of measurements in the Industry 4.0 era. Five years ago, a contact coordinate measuring machine might still have been regarded as the most common and most accurate tool involved in the coordinate technique (it allows one to obtain accuracy of up to 0.1 μm). It is still hard to reach this accuracy using contactless, optical systems, but they display other important advantages, mainly the mentioned shortening of the measurement time and the possibility of obtaining information-rich measurement results. The trend observed in recent years clearly indicates that systems of this type, additionally operating in connection with automation systems and devices such as industrial robots, will become one of the most popular tools for quality assessment in advanced production processes in the future.
We invite contributions to this Special Issue on topics including, but not limited to, the following areas:
- Optical coordinate measuring machines
- Multi-sensor coordinate measuring machines
- Optical metrology in manufacturing
- CCD/CMOS sensors
- Laser triangulation sensors
- Structured light sensors
- Vision-based measurement systems
- Fringe optics
- Optical metrology systems integrated in manufacturing tools and lines
- Optical solutions for in-process control
- Optical in situ measurements
- In-line optical inspection systems
- Automation of optical measuring systems.
- Portable optical measuring systems
- Optical metrology systems in Industry 4.0
- Traceability of optical metrology systems
- Calibration and verification
- Uncertainty estimation
- Identification and correction of error sources
- System accuracy modeling
Prof. Dr. Adam Gąska
Prof. Dr. Ksenia Ostrowska
Prof. Dr. Jerzy A. Sładek
Guest Editors
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Keywords
- optical CMM
- optical metrology
- coordinate metrology
- Industry 4.0
- accuracy improvements
- CCD/CMOS sensors
- confocal sensor laser triangulation sensor
- structured light sensor
- white light sensor
- video probe
- digital image processing
- multi-sensor
- CMM measurement uncertainty
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