Online/Onsite Optical Metrology Techniques: Challenges, Trends and Solutions
A special issue of Machines (ISSN 2075-1702). This special issue belongs to the section "Robotics, Mechatronics and Intelligent Machines".
Deadline for manuscript submissions: closed (15 September 2023) | Viewed by 6293
Special Issue Editors
Interests: optical metrology
Interests: high precision vision measurement; digital holographic measurement technology; digital image correlation
Interests: optical metrology
Interests: Industry 4.0; intelligent manufacturing system; artificial intelligence
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In recent years, online and onsite optical metrology techniques have received extensive attention for many dimensional control research and industrial applications. Some representative techniques adapt 2D imaging measurement, stereo vision, 3D laser scanning and structured light to acquire the product dimensional information to evaluate the manufacturing error or improve the sequential manufacturing process. Compared with the traditional manual or offline sampling inspection methods, these online and onsite optical metrology techniques have remarkable advantages in regard to accuracy, efficiency and the amount of collected data, thus changing the way the inspection applications are performed and providing new possibilities for online/onsite product quality control.
This Special Issue is focused on the study, research and discovery of the challenges, trends and solutions related to online and onsite optical metrology techniques. It includes the novel design of optical sensors, improved methods for measurement performance enhancement, novel mathematical methods for advanced data processing and various specific solutions for online/onsite optical metrology applications.
The technical scope of this Special Issue includes, but is not limited to:
- 2D and 3D optical metrology techniques;
- Accuracy and efficiency improvements for optical metrology;
- Image and point cloud processing algorithms;
- High reflective surface measurement;
- Novel vision sensors and instruments;
- Robot integrated optical metrology systems;
- AI-assisted optical metrology;
- Online/onsite optical metrology solutions;
- Vision Detection or 3D Reconstruction using UAV;
- High-precision vision measurement in vibration environment;
- Digital image correlation technology under extreme conditions.
Dr. Xiaobo Chen
Dr. Xiao Yang
Dr. Jinkai Zhang
Prof. Dr. Jinsong Bao
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Machines is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- optical metrology
- online/onsite inspection
- data processing
- error compensation
- system modeling
- system calibration
- deep learning
Benefits of Publishing in a Special Issue
- Ease of navigation: Grouping papers by topic helps scholars navigate broad scope journals more efficiently.
- Greater discoverability: Special Issues support the reach and impact of scientific research. Articles in Special Issues are more discoverable and cited more frequently.
- Expansion of research network: Special Issues facilitate connections among authors, fostering scientific collaborations.
- External promotion: Articles in Special Issues are often promoted through the journal's social media, increasing their visibility.
- e-Book format: Special Issues with more than 10 articles can be published as dedicated e-books, ensuring wide and rapid dissemination.
Further information on MDPI's Special Issue polices can be found here.