New Perspectives in Ultra Precision Manufacturing and Micro-Nano Inspection Technology
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanophotonics Materials and Devices".
Deadline for manuscript submissions: 20 July 2025 | Viewed by 299
Special Issue Editors
Interests: ultra precision polishing; ion beam polishing; magnetorheological finishing; defect detection; AR; precision engineering; ultra smooth; advanced optical fabrication; low damage
Interests: defect inspection; optical design; illumination design; machine vision; image processing
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The ultra-precision manufacturing and micro-nano inspection technology field has witnessed remarkable advancements in recent years, driven by the escalating demand for high-performance optical systems across various applications. Innovations in materials science, fabrication methodologies, and sophisticated measurement techniques have enabled researchers to explore novel ultra-precision manufacturing and inspection approaches that potentially revolutionize this field. This Special Issue on "New Perspectives in Ultra Precision Manufacturing and Micro-Nano Inspection Technology" showcases the latest research and developments, highlighting pioneering concepts, methodologies, and practical applications. Key areas covered in this Special Issue include, but are not limited to, ultra-precision polishing, advanced materials, precision manufacturing techniques, computational methods and algorithms, ion beam polishing, magnetorheological finishing, ultra smooth, low damage, measurement and metrology, optical design, integrated optoelectronic devices, machine vision, and defect detection.
We believe this collection of articles will be an invaluable resource for professionals seeking to advance the frontiers of ultra-precision manufacturing and micro-nano inspection technology. We hope it will inspire further innovation and foster collaboration among scientists, researchers, and engineers, ultimately leading to new perspectives and breakthroughs in this field.
Both theoretical and experimental studies and comprehensive reviews and survey papers are welcome.
Prof. Dr. Feng Shi
Dr. Xing Peng
Guest Editors
Manuscript Submission Information
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Keywords
- ultra precision polishing
- advanced materials
- ion beam polishing
- magnetorheological finishing
- ultra smooth
- low damage
- machine vision
- defect detection
- measurement and metrology
- optical design
- integrated optoelectronic devices
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