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Nanomaterials
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An Overview of the Recent Advances in Advanced Electron Microscopy...
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An Overview of the Recent Advances in Advanced Electron Microscopy Imaging, Spectroscopy and Their Related Applications

A special issue of Nanomaterials (ISSN 2079-4991).

Deadline for manuscript submissions: closed (31 December 2022) | Viewed by 2526

Special Issue Editors

Dr. Francis Leonard Deepak

E-Mail Website
Guest Editor
International Iberian Nanotechnology Laboratory, Braga, Portugal
Interests: electron microscopy; materials science; nanomaterials; 1D and 2D materials; energy-related materials; catalysts; nucleation and growth at the atomic scale; in situ TEM; nanoalloys; clusters; single-atom catalysts; transition metal chalcogenides; layered materials; battery materials; electrocatalysts; atomic scale characterization
Prof. Dr. Junjie Li

E-Mail Website
Guest Editor
Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi, China
Interests: advanced functional materials; nanomaterials; crystal nucleation and growth; electron microscopy

Special Issue Information

Dear Colleagues,

Advanced electron microscopic techniques including aberration-corrected TEM/STEM, in situ TEM and the corresponding analytical techniques (EDS and EELS) have had a tremendous impact on the way nanomaterials are currently being visualized, analyzed and understood. The very high spatial resolution and temporal resolution made possible by some of the recent developments have made them very exciting, with several new and recent discoveries related to the field of materials. This Special Issue thus serves to bring a status update to this exciting field. Electron microscopic techniques and their applications to a variety of clusters, nanomaterials and 2D materials including catalysts and energy-related materials are the focus of this Special Issue. In addition, techniques including 3D tomography, spectroscopic tomography and in situ techniques which are being explored are also encouraged to be part of this Special Issue. Recent advances in electron microscopic techniques including operando TEM employing specialized holders: liquid cell holders, gas cell holders, etc., and their related applications are also encouraged to contribute to this Special Issue. Perspectives, highlights, review articles, communications and full papers are strongly encouraged for this Special Issue.

Dr. Francis Leonard Deepak
Prof. Dr. Junjie Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2900 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • aberration-corrected electron microscopy
  • analytical electron microscopy
  • in situ TEM/STEM
  • operando TEM/STEM
  • cluster and nanomaterials
  • 2D materials

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Published Papers (2 papers)

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Research

10 pages, 37481 KiB  
Article
In Situ Observations Reveal the Five-fold Twin-Involved Growth of Gold Nanorods by Particle Attachment
by Qi Sun, Loukya Boddapati, Linan Wang, Junjie Li and Francis Leonard Deepak
Nanomaterials 2023, 13(5), 796; https://doi.org/10.3390/nano13050796 - 21 Feb 2023
Cited by 3 | Viewed by 2484
Abstract
Crystallization plays a critical role in determining crystal size, purity and morphology. Therefore, uncovering the growth dynamics of nanoparticles (NPs) atomically is important for the controllable fabrication of nanocrystals with desired geometry and properties. Herein, we conducted in situ atomic-scale observations on the [...] Read more.
Crystallization plays a critical role in determining crystal size, purity and morphology. Therefore, uncovering the growth dynamics of nanoparticles (NPs) atomically is important for the controllable fabrication of nanocrystals with desired geometry and properties. Herein, we conducted in situ atomic-scale observations on the growth of Au nanorods (NRs) by particle attachment within an aberration-corrected transmission electron microscope (AC-TEM). The results show that the attachment of spherical colloidal Au NPs with a size of about 10 nm involves the formation and growth of neck-like (NL) structures, followed by five-fold twin intermediate states and total atomic rearrangement. The statistical analyses show that the length and diameter of Au NRs can be well regulated by the number of tip-to-tip Au NPs and the size of colloidal Au NPs, respectively. The results highlight five-fold twin-involved particle attachment in spherical Au NPs with a size of 3–14 nm, and provide insights into the fabrication of Au NRs using irradiation chemistry. Full article
(This article belongs to the Special Issue An Overview of the Recent Advances in Advanced Electron Microscopy Imaging, Spectroscopy and Their Related Applications)
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8 pages, 2093 KiB  
Article
Heteroepitaxy Growth and Characterization of High-Quality AlN Films for Far-Ultraviolet Photodetection
by Titao Li, Yaoping Lu and Zuxin Chen
Nanomaterials 2022, 12(23), 4169; https://doi.org/10.3390/nano12234169 - 24 Nov 2022
Cited by 5 | Viewed by 1623
Abstract
The ultra-wide bandgap (~6.2 eV), thermal stability and radiation tolerance of AlN make it an ideal choice for preparation of high-performance far-ultraviolet photodetectors (FUV PDs). However, the challenge of epitaxial crack-free AlN single-crystalline films (SCFs) on GaN templates with low defect density has [...] Read more.
The ultra-wide bandgap (~6.2 eV), thermal stability and radiation tolerance of AlN make it an ideal choice for preparation of high-performance far-ultraviolet photodetectors (FUV PDs). However, the challenge of epitaxial crack-free AlN single-crystalline films (SCFs) on GaN templates with low defect density has limited its practical applications in vertical devices. Here, a novel preparation strategy of high-quality AlN films was proposed via the metal organic chemical vapor deposition (MOCVD) technique. Cross-sectional transmission electron microscopy (TEM) studies clearly indicate that sharp, crack-free AlN films in single-crystal configurations were achieved. We also constructed a p-graphene/i-AlN/n-GaN photovoltaic FUV PD with excellent spectral selectivity for the FUV/UV-C rejection ratio of >103, a sharp cutoff edge at 206 nm and a high responsivity of 25 mA/W. This work provides an important reference for device design of AlN materials for high-performance FUV PDs. Full article
(This article belongs to the Special Issue An Overview of the Recent Advances in Advanced Electron Microscopy Imaging, Spectroscopy and Their Related Applications)
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