Fault Detection and Process Diagnostics by Using Big Data Analytics in Industrial Applications
A special issue of Processes (ISSN 2227-9717). This special issue belongs to the section "Process Control and Monitoring".
Deadline for manuscript submissions: closed (20 February 2021) | Viewed by 80135
Special Issue Editors
Interests: advanced process control; engineering optimization; quality engineering; big data analytics; intelligent computing
Interests: big data analytics; machine learning and deep learning; manufacturing intelligence; fault detection; time series data analysis
Special Issue Information
Dear Colleagues,
Fault detection and process diagnostics poses an important challenge in industrial processes. It is the central component of abnormal event management, which has attracted abundant attention in recent literature. Abnormal event management deals with the timely detection, diagnosis, and correction of abnormal conditions of faults in a process. Early detection and diagnosis of process faults while the engineering process is still operating in a controllable status can help to circumvent abnormal event progression and reduce yield loss.
Process diagnostics takes a deep dive into process phenomena through onsite measurement, key parameter and key processing time step identification, data crunching and analysis, understanding the relationships between operating conditions, materials and production quality for improved efficiency, solving process challenges, and for novel design/redesign.
This Special Issue on “Fault Detection and Process Diagnostics by Using Big Data Analytics in Industrial Applications” aims to curate novel advances in the development and application of big data analytics to address long-standing challenges in fault detection and process diagnostics in state-of-the-art industrial processes. Related topics include but are not limited to:
- Machine learning techniques for fault detection and process diagnostics;
- Deep learning techniques for fault detection and process diagnostics;
- Fault detection and process diagnostics using image processing techniques;
- Advanced process monitoring and control schemes developed within the framework of big data analytics;
- Strategy palnning and deployment of fault detection and process diagnostics;
- Intelligent alarm system and fault analysis;
- Fault detection and process diagnostics using dimension reduction and data visualization.
Papers submitted to this Special Issue are expected to provide an original contribution, proposing new solutions/frameworks, improvements to existing solutions, and new applications in emerging sectors. The paper can address the potential solution of specific problems in the sector of interest using algorithms, predictive analytics and prognostics, experimental tests, and numerical analysis within the context of big data analytics.
Prof. Dr. Shu-Kai S. Fan
Dr. Chia-Yu Hsu
Dr. You-Jin Park
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Processes is an international peer-reviewed open access monthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- fault detection and classification (FDC)
- process diagnostics
- fault analysis
- big data analytics
- data mining
- machine learning
- deep learning
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