Machine Learning Based Feature Recognition and Image Processing in Sensing
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: closed (28 April 2023) | Viewed by 10970
Special Issue Editor
Special Issue Information
Dear Colleagues,
Recently, we have seen a growing interest in the potential use of Feature Recognition and Image Processing. Feature Recognition (FR) is a technique to identify and extract application-specific information from input models for downstream engineering activities. Image feature recognition is an important area of artificial intelligence, aimed at recognizing targets and objects in various modes. Machine learning (ML) is a field of inquiry devoted to understanding and building methods that 'learn'. It is the method that leverages data to improve performance on some set of tasks and allows software applications to become more accurate at predicting outcomes without being explicitly programmed to do so. Benefiting from the excellent ability of feature learning, machine learning has achieved good results in the field of feature recognition.
The feature recognition method still faces challenges such as feature extraction difficulties, poor classification and recognition effects, high sensitivity and so on, and needs to be improved in theory and method. Thus, feature recognition based on machine learning has become crucial in many fields. This Special Issue, therefore, aims to put together original research and review articles on recent advances, technologies, solutions, applications, and new challenges in the field of machine learning-based feature recognition.
Potential topics include but are not limited to: feature recognition; image processing; image feature recognition; machine learning; pattern recognition.
Prof. Dr. Dan Zeng
Guest Editor
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Keywords
- feature recognition
- image processing
- image feature recognition
- machine learning
- pattern recognition
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