Journal of Low Power Electronics and Applications

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J. Low Power Electron. Appl., Volume 1, Issue 3 (December 2011) – 2 articles , Pages 334-372

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251 KiB

Open AccessArticle

Low Power Testing—What Can Commercial Design-for-Test Tools Provide?

by Xijiang Lin

J. Low Power Electron. Appl. 2011, 1(3), 357-372; https://doi.org/10.3390/jlpea1030357 - 9 Dec 2011

Cited by 3 | Viewed by 7629

Abstract

Minimizing power consumption during functional operation and during manufacturing tests has become one of the dominant requirements for the semiconductor designs in the past decade. From commercial design-for-test (DFT) tools’ point of view, this paper describes how DFT tools can help to achieve [...] Read more.

(This article belongs to the Special Issue Industrial Aspects of Low Power Design Recent Trends and Methods)

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2222 KiB

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Error Detection and Recovery Techniques for Variation-Aware CMOS Computing: A Comprehensive Review

by Joseph Crop, Evgeni Krimer, Nariman Moezzi-Madani, Robert Pawlowski, Thomas Ruggeri, Patrick Chiang and Mattan Erez

J. Low Power Electron. Appl. 2011, 1(3), 334-356; https://doi.org/10.3390/jlpea1030334 - 11 Oct 2011

Cited by 10 | Viewed by 11587

Abstract

While Moore’s law scaling continues to double transistor density every technology generation, new design challenges are introduced. One of these challenges is variation, resulting in deviations in the behavior of transistors, most importantly in switching delays. These exaggerated delays widen the gap between the average and the worst case behavior of a circuit. Conventionally, circuits are designed to accommodate the worst case delay and are therefore becoming very limited in their performance advantages. Thus, allowing for an average case oriented design is a promising solution, maintaining the pace of performance improvement over future generations. However, to maintain correctness, such an approach will require on the fly mechanisms to prevent, detect, and resolve violations. This paper explores such mechanisms, allowing the improvement of circuit performance under intensifying variations. We present speculative error detection techniques along with recovery mechanisms. We continue by discussing their ability to operate under extreme variations including sub-threshold operation. While the main focus of this survey is on circuit approaches, for its completeness, we discuss higher-level, architectural and algorithmic techniques as well. Full article

(This article belongs to the Special Issue Low Power Design Methodologies and Applications)

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J. Low Power Electron. Appl., Volume 1, Issue 3 (December 2011) – 2 articles , Pages 334-372

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