Materials Characterizations Using In-Situ Techniques
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 May 2022) | Viewed by 27224
Special Issue Editors
Interests: electron microscopy; multiferroic materials; quantum dots; metals and alloys; ceramics
Interests: electron microscopy; synthesis/processing–structure–property relationship; nanomaterials; metals and alloys; ceramics; ferroelectrics
Special Issue Information
Dear Colleagues,
It is well-known that the properties of materials are closely related to their microstructures. Understanding the structure–property relationships of materials is therefore critical for designing materials with superior properties that meet the application requirements. Most previous studies of the structure–property relationships of materials were mainly carried out through separate property measurement and structural characterization, which in many cases do not reveal the real nature of materials’ behaviour under external stimuli (e.g., force, heat, and voltage) and the fundamental origins of materials’ properties. With the development of material characterization technology, it is now possible to conduct simultaneous in situ mechanical and physical property measurements and structural characterization using methods including optical microscopy, electron microscopy, X-ray diffraction, and scanning probe microscopy. The development of state-of-the-art in situ characterization techniques has significantly advanced our understanding of the structure–property relationships of materials. Here, we propose a Special Issue in Materials focusing on recent advances in in situ microscopy techniques and their applications in materials research. Contributions in the forms of review articles and research papers are all welcome. Content covered in this Special Issue will include but is not limited to the following fields:
- In situ structural characterization using optical microscopy, electron microscopy, scanning probe microscopy, and synchrotron radiation techniques;
- In situ property measurement/testing;
- Development of in situ techniques;
- Dynamic simulations to uncover deformation mechanisms and/or fundamental physics of materials.
Dr. Zibin Chen
Prof. Dr. Xiaozhou Liao
Prof. Dr. Wenge Yang
Guest Editors
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Keywords
- in situ
- simulation
- characterization
- electron microscopy
- synchrotron radiation
- optical microscopy
- scanning probe microscopy
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Related Special Issue
- In-Situ X-Ray Tomographic Study of Materials in Materials (18 articles)