Metrology in Times of Digitization
A special issue of Metrology (ISSN 2673-8244).
Deadline for manuscript submissions: closed (31 October 2022) | Viewed by 3545
Special Issue Editor
Interests: dimensional metrology; interferometry; surface roughness; surface filtering
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The adoption of digital technology in the world of metrology and calibration has been accelerating in recent years. The traditional paperwork of making manual records of measurements, typing and signing certificates is being replaced by their digital counterparts. Additionally, the recording of environmental conditions, original measurement data and much more—if not all—of the documentation required in the ISO 17025 is saved on hard disks instead of binders in cupboards, or even in the cloud. In the technology aspect there is the parallel development of big data, the application of data mining and artificial intelligence. In 2022, metrology day is dedicated to this subject, especially regarding the concept that data must be “FAIR”, an acronym that stands for findable, accessible, interoperable and reusable. Metrology will dedicate a Special Issue to this subject, where authors are invited submit contributions that focus on any of these or related aspects of metrology.
Prof. Dr. Han Haitjema
Guest Editor
Manuscript Submission Information
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Keywords
- metrology 4.0
- big data
- open source
- digitization
- data mining
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