Sensors for Optical Metrology 2022
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Nanosensors".
Deadline for manuscript submissions: closed (10 December 2022) | Viewed by 4869
Special Issue Editor
Interests: dimensional metrology; interferometry; surface roughness; surface filtering
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The aim of this Special Issue is to bring together researchers active in the research, development, calibration, and characterization of sensors that are applied in optical metrology in order to achieve the highest accuracy and, thus, the lowest uncertainty.
In the continuous development towards higher speed, lower cost, more data, smaller acquisition times, better traceability, less user intervention, and more autonomous systems, the development, characterization, and calibration of sensors for optical metrology is even more immanent than before.
Works on classical technologies, such as Fizeau interferometers and displacement laser interferometers, are welcome, as well as those based on more recent innovative techniques, such as frequency combs and optical clocks, instantaneous surface profiling, areal chromatic confocal measurements, multi-wavelength digital holography, wavefront sensors, laser distance sensors, etc. Manuscripts on the overcoming of challenges, related, for example, to in-process use of sensors for accurate surface measurements, will also be appreciated.
I cordially invite you to share your work, expertise, and insights with the optical measurement and calibration community in the form of research articles and reviews.
Prof. Dr. Han Haitjema
Guest Editor
Manuscript Submission Information
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Keywords
- sensor
- frequency comb
- interferometry
- digital holography
- calibration
- triangulation
- free form optics
- traceability
- chromatic confocal sensor
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