Surface Analysis Techniques for the Study of Advanced Nanostructures
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanocomposite Materials".
Deadline for manuscript submissions: closed (30 November 2021) | Viewed by 18824
Special Issue Editor
Interests: surface science for advanced materials
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
In the last decade, we have witnessed an exponential increase in the level of complexity of nanomaterials, leading to the production of smaller-sized objects and 2D structures. In this dimension scale, a key role is played by the surface and interface of the materials. For this reason, surface analysis techniques represent a powerful investigatory tool for evaluating the properties of nanomaterials. This Special Issue will be focused on the advancement of a wide variety of surface analysis techniques employed to study and to characterize advanced nanomaterials. X-ray and UV photoelectron spectroscopies, Auger electron spectroscopy, secondary-ion mass spectroscopy, scanning probe microscopy, and secondary electron microscopy will be explored, showing how they can help to answer many questions at the nanoscale.
Dr. Alessio Mezzi
Guest Editor
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Keywords
- XPS
- UPS
- AES
- SIMS
- TEM
- AFM
- STM
- nanoparticles
- nanorods
- nanotubes
- thin films
- 2D materials
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