Advances in Microscopy and Spectroscopy Techniques Applied to Nanomaterials
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanocomposite Materials".
Deadline for manuscript submissions: closed (31 January 2023) | Viewed by 4568
Special Issue Editor
Special Issue Information
Dear Colleagues,
The study of nanomaterials involves more and more powerful techniques to decipher their physical and chemical properties exhibiting new behavior at the nanometer scale. The most widespread examples are fullerenes, nanotubes, one-atom-thick 2D materials and thin nanostructured films on surfaces. In particular, the exploration of these substances has been made possible with great success using microscopy and spectroscopy techniques, the most popular being SEM, TEM, SPM, light–matter interaction probes such as Raman scattering, optical and infrared absorption, luminescence spectroscopy, X-ray photoelectron spectroscopy and many others. The modeling of nanostructures has also undergone a rapid impetus parallel to technical advances, and is crucial to predict and simulate the properties of nanomaterials. This Special Issue is devoted to the advancement of the abovementioned techniques for the investigation of various nanomaterials encompassing quantum dots or nanoparticles, biomaterials, composites, pigments, chalcogenides, carbon allotropes, nanowires, nanotubes and 2D materials for applications in photonics, nanomedicine, environment, energy storage, catalysis and sensors. Innovative and emerging techniques as well as new kinds of nanomaterials with remarkable properties will be welcome for this Special Issue. Contributions can be original articles or mini-reviews.
Dr. Eric Faulques
Guest Editor
Manuscript Submission Information
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Keywords
- nanomaterials
- nanotechnology
- microscopy
- spectroscopy
- Raman
- infrared
- self-assembly
- biomaterials
- STM
- AFM
- KFM
- modeling
- characterization
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