Nondestructive Testing and Imaging Based on Electromagnetic Fields and Waves
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Optics and Lasers".
Deadline for manuscript submissions: closed (31 July 2019) | Viewed by 96194
Special Issue Editor
Interests: EM sensing; instruments; NDT; tomography
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Electromagnetic Fields and Waves can be used to interrogate an object non-destructively for the purpose of object characterization, defect detection, structural health monitoring, process monitoring, remote sensing, and imaging. In recent years, there have been new developments of this field in various aspects such as sensor design, instrument development, new algorithms, and applications. This special issue of Applied Sciences on “Non-destructive Testing and Imaging Based on Electromagnetic Fields and Waves” welcomes contributions from the following topics:
- Novel EM sensing principle
- EM Sensor modelling
- EM Sensor design and optimisation
- EM sensing system developments such as those based on FPGA, DSP, etc.
- Materials characterization
- Defect detection
- Process sensing and imaging
- Signal and imaging processing
- Subsurface mapping and imaging of maritime targets
Dr. Wuliang Yin
Guest Editor
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Keywords
- Nondestructive Testing (NDT)
- Eddy current
- Microwave
- Electrical Tomography
- Electromagnetic Sensing
- Electromagnetic imaging
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