Artificial Intelligence in Fault Diagnosis and Signal Processing
A special issue of Applied Sciences (ISSN 2076-3417). This special issue belongs to the section "Computing and Artificial Intelligence".
Deadline for manuscript submissions: 20 January 2025 | Viewed by 15174
Special Issue Editors
Interests: condition monitoring; power quality; fault diagnosis; signal processing; vibration analysis; electrical power engineering; control theory; instrumentation
Special Issues, Collections and Topics in MDPI journals
Interests: electrical machines and drives; diagnostics of electrical machines; renewable energies and smart grids
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The detection and diagnosis of faults is essential in industrial processes, as the early detection of faults avoids damage that may be irreparable to machinery, which would reduce the performance of the control system and reduce the process efficiency, which would result in a decrease in production. Additionally, in terms of industrial safety, this would facilitate safer operations, reducing the risk to plant workers. Therefore, the early detection and correct diagnosis of faults will facilitate decision making that allows corrective actions to be taken to repair damaged components. In recent years, various machine fault detection techniques have emerged; additionally, artificial intelligence and signal processing are essential to achieving this goal. However, the topic continues to generate new trends in methodologies related to multiple fault detection, novelty detection, data mining, development in hardware, etc.
The goal of this issue is to bring researchers and industrial practitioners together to share their research findings and present ideas that are relevant in the field of fault diagnosis using artificial intelligence and signal processing.
Prof. Dr. Roque A. Osornio-Rios
Dr. Athanasios Karlis
Dr. Andres Bustillo Iglesias
Guest Editors
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Keywords
- neural networks
- machine learning
- sensors
- novelty detection
- data mining
- signal processing methods
- signal processing implementation
- FPGA
- HIL
- industrial applications
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Planned Papers
The below list represents only planned manuscripts. Some of these manuscripts have not been received by the Editorial Office yet. Papers submitted to MDPI journals are subject to peer-review.
Title: Insulator Defect Detection Algorithm Based on Multi-Scale Detection Transformer
Author: Zou
Highlights: 1. To alleviate the confusion between the foreground and background, we introduce a context-based attention module to fully learn the relationship between defects and their backgrounds.
2. We introduce the insulators defect IDIoU loss to optimize the instability issues caused by small defects in the matching process, thereby accelerating training speed.