Doping Techniques in Emerging Semiconductors and Devices
A special issue of Micromachines (ISSN 2072-666X). This special issue belongs to the section "D:Materials and Processing".
Deadline for manuscript submissions: closed (31 October 2021) | Viewed by 21183
Special Issue Editor
Interests: 2D materials; nanodevices; nanomaterials; mixed-dimensional transistors; device physics; neuromorphic devices; integrated circuit; sensors; optoelectronic devices; organic semiconductors; memristors; floating-gate memories; charge traps; charge transports; carbon nanotubes; nanoscale devices; lithography; spectroscopies
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Special Issue Information
Dear Colleagues,
Over the past decade, emerging thin-film semiconductors such as transition-metal dichalcogenides (TMDs), carbon nanotubes, oxide, and organic materials have been intensively investigated as next-generation semiconducting materials owing to their excellent electrical, chemical, mechanical, and optical properties. However, conventional doping techniques such as ion-implantation damage these thin-film materials, and there is a great need to develop an alternative method to control the electrical properties.
This special issue calls for research papers, reviews, and short communications related to state-of-the-art developments that contribute to novel doping techniques for high-performance device applications.
Prof. Dr. Hocheon Yoo
Guest Editor
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Keywords
- Two-dimensional materials
- Oxide semiconductors
- Doping mechanism
- Organic dopants
- Molecular and remote doping techniques
- Dielectric interface
- P-doping/n-doping
- Charge transfer
- Surface functionalization
- Dipole-induced doping
- Thin-film transistors
- Contact doping
- Work function engineering
- Solution doping methods
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