Nanoscale Self-Assembly: Nanopatterning and Metrology
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanofabrication and Nanomanufacturing".
Deadline for manuscript submissions: closed (15 July 2021) | Viewed by 34919
Special Issue Editor
Interests: metrology; clock copolymers; nanopatterning; hierarchical assembly; directed self-assembly
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
The self-assembly process underlies a plethora of natural phenomena from the macro to the nano scale. Often, technological development has found great inspiration in the natural world, as evidenced by numerous fabrication techniques based on self-assembly. One striking example is given by epitaxial growths, in which atoms represent the building blocks. In lithography, the use of self-assembling materials is considered an extremely promising patterning option to overcome the size scale limitations imposed by the conventional photolithographic methods. To this purpose, in the last two decades several supramolecular self-assembling materials have been investigated and successfully applied to create patterns at a nanometric scale (e.g., spherical colloids, block copolymers, nanotubes, and nanowires). Although considerable progress has been made so far in the control of self-assembly processes applied to nanolithography, a number of unresolved problems related to the reproducibility and metrology of the self-assembled features are still open. Addressing these issues is mandatory in order to allow the widespread diffusion of self-assembling materials for applications such as microelectronics, photonics, or biology. In this context, the aim of the present Special Issue is to gather original research papers and comprehensive reviews covering various aspects of the self-assembly processes applied to nanopatterning. Topics include but are not limited to the following:
- The theory, simulation, and synthesis of self-assembling materials;
- The development of novel self-assembly methods;
- The realization of nanometric structures and devices;
- The improvement of long-range order (directed self-assembly, dewetting, coassembly, and hierarchical assembly);
- Metrology issues related to the nanoscale characterization of self-assembed structures.
Dr. Federico Ferrarese Lupi
Guest Editor
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Keywords
- Self-assembly
- Nanopatterning
- Directed self-assembly
- Hierarchical assembly
- Clock copolymers
- Nanosphere lithography
- Nanomaterials
- Nano metrology
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