Advances in Multi-scale Mechanical Characterization of Materials with Optical Methods
A special issue of Materials (ISSN 1996-1944). This special issue belongs to the section "Advanced Materials Characterization".
Deadline for manuscript submissions: closed (10 March 2021) | Viewed by 37662
Special Issue Editor
Interests: bioengineering and cell mechanics; nanosciences and nanotechnology; optical methods; materials science and characterization; structural optimization
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
It is my great pleasure to announce this Special Issue “Advances in Multi-scale Mechanical Characterization of Materials with Optical Methods”, which will appear in Materials next year.
Mechanical characterization of materials is a very hot topic, attracting great interest from the scientific community. The development of new materials and use of “traditional” materials in more demanding applications must be supported by efficient characterization techniques. Optical Methods (OM) are naturally suited for mechanical characterization of materials in view of their capability to accurately measure displacements, strains and stresses in real time and to gather full field information without altering specimen conditions. OM cover a full-range of wavelengths from X-ray to visible lights and infrared. Non-conventional illumination and super-resolution techniques may increase measurement resolutions to the nanoscale.
Multi-scale analysis is the most correct approach to characterization of materials because “macroscopic” mechanical behavior averages behaviors exhibited by material elements at the micro- and nanoscale. A definite strength of OM is the possibility of changing measurement scales by properly modulating wave frequencies and setting parameters of experimental setups. For example, the Moiré techniques can pass from small to large deformations by changing the pitch of the grating. The multi-scale ability is fundamental in complex fields like bioengineering, MEMS, high precision metrology, etc.
This Special Issue will focus on the advances in the multi-scale mechanical (statical and dynamical) characterization of materials with optical methods. The aim is to provide a forum on the state-of-the-art and frontier applications of OM for material characterization. Submissions should be in the form of original research articles or authoritative review papers on the following, non-exhaustive list of topics:
- Moiré, speckle and holography methods;
- Image correlation methods;
- Hybrid methods;
- Inverse methods;
- Microscopy techniques (including fluorescence and electron microscopy);
- Non-conventional illumination and super-resolution;
- Mechanics of Materials and Constitutive Models;
- Aerospace and Aeronautical Engineering;
- Bioengineering and Biomechanics;
- Nanometrology.
Prof. Luciano Lamberti
Guest Editor
Manuscript Submission Information
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Keywords
- Multi-scale Mechanical Characterization (static and dynamic)
- Optical Methods
- Microscopy and Super-resolution
- Hybrid and Inverse methods
- Metrology
- Nanoscience and Nanotechnology
- Aerospace Engineering
- Bioengineering and Biomechanics
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